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Comparison of Cliff–Lorimer-Based Methods of Scanning Transmission Electron Microscopy (STEM) Quantitative X-Ray Microanalysis for Application to Silicon Oxycarbides Thin Films
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue 3 / June 2018
- Published online by Cambridge University Press:
- 31 May 2018, pp. 193-206
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- June 2018
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Oxygen X-Ray Maps: Comparing a Vintage WDS System with a Modern SDD System
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- Journal:
- Microscopy Today / Volume 24 / Issue 5 / September 2016
- Published online by Cambridge University Press:
- 09 September 2016, pp. 34-37
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- September 2016
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Quantitative X-Ray Microanalysis of Thin NiO Films by Monte Carlo and Cliff-Lorimer Methods
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- Journal:
- Microscopy Today / Volume 22 / Issue 2 / March 2014
- Published online by Cambridge University Press:
- 11 March 2014, pp. 28-35
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- March 2014
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FIB Preparation of a NiO Wedge-Lamella and STEM X-Ray Microanalysis for the Determination of the Experimental k(O-Ni) Cliff-Lorimer Coefficient
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue 1 / February 2013
- Published online by Cambridge University Press:
- 03 January 2013, pp. 79-84
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- February 2013
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X-Ray Microanalysis Combined with Monte Carlo Simulation for the Analysis of Layered Thin Films: The Case of Carbon Contamination
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue 2 / April 2009
- Published online by Cambridge University Press:
- 16 March 2009, pp. 99-105
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- April 2009
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Quantitative Thin-Film X-ray Microanalysis by STEM/HAADF: Statistical Analysis for Precision and Accuracy Determination
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue 4 / August 2006
- Published online by Cambridge University Press:
- 14 July 2006, pp. 318-321
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- August 2006
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